CVE-2024-53017

June 4, 2025, 2:54 p.m.

6.6
Medium

Description

Memory corruption while handling test pattern generator IOCTL command.

Product(s) Impacted

Vendor Product Versions
Qualcomm
  • Test Pattern Generator
  • *

Weaknesses

Common security weaknesses mapped to this vulnerability.

CWE-823
Use of Out-of-range Pointer Offset
The product performs pointer arithmetic on a valid pointer, but it uses an offset that can point outside of the intended range of valid memory locations for the resulting pointer.

*CPE(s)

Affected systems and software identified for this CVE.

Type Vendor Product Version Update Edition Language Software Edition Target Software Target Hardware Other Information
a qualcomm test_pattern_generator / / / / / / / /

References

https://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.html

Tags

product-security@qualcomm.com
CWE-823
2025-06-03
CVE-2024-53017

CVSS Score

6.6 / 10

CVSS Data - 3.1

  • Attack Vector: LOCAL
  • Attack Complexity: LOW
  • Privileges Required: LOW
  • Scope: UNCHANGED
  • Confidentiality Impact: LOW
  • Integrity Impact: HIGH
  • Availability Impact: LOW

    • CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L

    View Vector String

Timeline

Published: June 3, 2025, 6:15 a.m.
Last Modified: June 4, 2025, 2:54 p.m.

Status : Awaiting Analysis

CVE has been recently published to the CVE List and has been received by the NVD.

More info

Source

product-security@qualcomm.com

*Disclaimer: Some vulnerabilities do not have an associated CPE. To enhance the data, we use AI to infer CPEs based on CVE details. This is an automated process and might not always be accurate.